most citedStrong electron-electron interactions in a dilute weakly-localized metal near a metal-to-insulator transition

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cond-mat.mtrl-sci2025

Overcoming Labelled Data Scarcity for Defect Classification in Scanning Tunneling Microscopy

Nikola L. Kolev, Max Trouton, Filippo Federici Canova +4

Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of sin…

cond-mat.mtrl-sci2025

Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO

Adam J. Czarnecki, Nikola L. Kolev, Patrick See +5

As silicon-based devices continue to shrink to the nanoscale, traps at the Si-SiO interface pose increasing challenges to device performance. These traps reduce channel carrier…