2 papers
quant-ph2024
Element-specific, non-destructive profiling of layered heterostructures
Nicolò D'Anna, Jamie Bragg, Elizabeth Skoropata +16
Fabrication of semiconductor heterostructures is now so precise that metrology has become a key challenge for progress in science and applications. It is now relatively straightfor…
cond-mat.mes-hall2024
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…