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cond-mat.mtrl-sci2023
Dynamic STEM-EELS for single atom and defect measurement during electron beam transformations
Kevin M. Roccapriore, Riccardo Torsi, Joshua Robinson +2
On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron…
cs.LG2023★ 2 cited
Physics and Chemistry from Parsimonious Representations: Image Analysis via Invariant Variational Autoencoders
Mani Valleti, Yongtao Liu, Sergei Kalinin
Electron, optical, and scanning probe microscopy methods are generating ever increasing volume of image data containing information on atomic and mesoscale structures and functiona…