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physics.optics2023★ 1 cited
Precise Measurement of Refractive Indices in Thin Film Heterostructures
Lukas W. Perner, Gar-Wing Truong, David Follman +5
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by…
physics.optics2023★ 24 cited
Substrate-transferred GaAs/AlGaAs crystalline coatings for gravitational-wave detectors: A review of the state of the art
G. D. Cole, S. Ballmer, G. Billingsley +16
In this Perspective we summarize the status of technological development for large-area and low-noise substrate-transferred GaAs/AlGaAs (AlGaAs) crystalline coatings for interferom…