3 papers
cond-mat.mtrl-sci2025
New Directions in Focused Ion Beam Induced Deposition for the Nanoprinting of Functional 3D Heterostructures
Frances Isabel Allen
The focused ion beam (FIB) microscope is well established as a high-resolution machining instrument capable of site-selectively removing material down to the nanoscale. Beyond subt…
physics.app-ph2024
Focused helium ion beam nanofabrication by near-surface swelling
Sherry Mo, Dana O. Byrne, Frances I. Allen
The focused helium ion beam microscope is a versatile imaging and nanofabrication instrument enabling direct-write lithography with sub-10-nm resolution. Subsurface damage and swel…
q-bio.BM2023
Focused helium ion and electron beam induced deposition of organometallic tips for dynamic AFM of biomolecules in liquid
Frances I. Allen, José María De Teresa, Bibiana Onoa
We demonstrate the fabrication of sharp nanopillars of high aspect ratio onto specialized atomic force microscopy (AFM) microcantilevers and their use for high-speed AFM of DNA and…