collaborators

19 papers

cs.CR2026

ColumnKeeper: Efficient Solutions to the ColumnDisturb Vulnerability in DRAM-based Systems

Andreas Kosmas Kakolyris, F. Nisa Bostanci, Ataberk Olgun +7

Modern DRAM chips are vulnerable to read disturbance phenomena such as RowHammer and RowPress, which induce bitflips after accessing nearby rows a certain number of times (the read…

cs.AR2026

Clutch: High Performance Vector-Scalar Comparison using DRAM via Chunked Temporal Coding

Daichi Tokuda, Tatsuya Kubo, Ismail Emir Yuksel +8

Vector-scalar comparison is a fundamental computation primitive that compares each element in a vector against a single scalar value. It is widely used in various data-intensive wo…

cs.AR2026

DejaVu: Why You Should Write to Your DRAM Rows Twice, Carefully

Haocong Luo, İsmail Emir Yüksel, Ataberk Olgun +4

We provide the first experimental demonstration of DejaVu, a phenomenon where the data previously written to DRAM cells affects DRAM's vulnerability to read disturbance. Our experi…

cs.AR2026

PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems

Daichi Tokuda, İsmail Emir Yüksel, Tatsuya Kubo +7

Processing-using-DRAM (PuD) is a promising computation paradigm that alleviates frequent data movement between main memory and processing units by using each DRAM column as a compu…

cs.AR2026

A Modern Large-Scale Memory Characterization Laboratory

Ataberk Olgun, Haocong Luo, Ismail Emir Yuksel +3

Real memory chip characterization yields insights into fundamental operational characteristics of modern memory, enabling new mechanisms that improve memory performance, robustness…

cs.CR2026

ScaleDisturb: Exploiting Temporal Asymmetry to Amplify Read Disturbance in Modern DRAM Chips

Jikun Wang, Haocong Luo, Ataberk Olgun +6

DRAM suffers from read disturbance phenomena (e.g., RowHammer and RowPress), where repeatedly accessing or continuously keeping open a DRAM row (aggressor row) induces bitflips in…