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20012017
most citedMagnetic particle hyperthermia: Neel relaxation in magnetic nanoparticles under circularly polarized field

33 citations · 131 across the 17 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

6 papers · 1 filter

cond-mat.mtrl-sci2017★ 9 cited

Designing the color of hot-dip galvanized steel sheet through destructive light interference using a Zn-Ti liquid metallic bath

Gábor Lévai, Melinda Godzsák, Tamás I. Török +5

The color of hot-dip galvanized steel sheet was adjusted in a reproducible way using a liquid Zn-Ti metallic bath, air atmosphere, and controlling the bath temperature as the only…

cond-mat.mtrl-sci2017★ 13 cited

Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry

M. N. Drozdov, Y. N. Drozdov, A. Csik +8

Quantification of Ge in Si1-xGex structures (0.092<x<0.78) was carried by time-of-flight secondary ion mass spectrometry (TOF-SIMS) and electron-gas secondary neutral mass spectrom…

cond-mat.mtrl-sci2014★ 23 cited

Near-substrate composition depth profile of direct current-plated and pulse-plated Fe-Ni alloys

Katalin Neuróhr, Attila Csik, Kálmán Vad +3

Composition depth profiles of d.c.-plated and pulseplated Fe-Ni alloys have been investigated with the reverse depth profile analysis method. When d.c. plating is applied, the mole…

cond-mat.mtrl-sci2009

Investigation of Sb diffusion in amorphous silicon

A. Csik, G. A. Langer, G. Erdelyi +3

Amorphous silicon materials and its alloys become extensively used in some technical applications involving large area of the microelectronic and optoelectronic devices. However, t…

cond-mat.mtrl-sci2009★ 1 cited

Reverse depth profiling of electrodeposited Co/Cu multilayers by SNMS

A. Csik, K. Vad, G. A. Langer +3

The overall quality of multilayer thin films prepared by electrodeposition is strongly influenced by the surface and interface roughness which increases with the layer number. For…

cond-mat.mtrl-sci2009

Application of Secondary Neutral Mass Spectrometry in the investigation of doped perovskites

K. Vad, J. Hakl, A. Csik +5

Electromagnetic properties of doped perovskites depend sensitively on the doping level. Both the superconducting transition temperature of Bi2Sr2Ca(Pr)Cu2O8+d compounds and the mag…