2 papers
eess.SP2024
An Alternative Method to Identify the Susceptibility Threshold Level of Device under Test in a Reverberation Chamber
Qian Xu, Kai Chen, Xueqi Shen +3
By counting the number of pass/fail occurrences of a DUT (Device under Test) in the stirring process in a reverberation chamber (RC), the threshold electric field (E-field) level c…
eess.SP2024
A Realisation of Channel Emulation in a Reverberation Chamber method for Over-the-Air Compliance Testing in Support of 3GPP Standardisation
Yunsong Gui, Tian Hong Loh
The inherent long decay power delay profile (PDP) in the reverberation chamber (RC) is a major challenge for accurate channel emulation of 3GPP channel model, which is widely used…