activity
20002023
most citedDimensional Crossover in Quasi One-Dimensional and High T_c Superconductors

115 citations · 726 across the 27 of their papers we have counts for

collaborators

27 papers

cond-mat.str-el2023

Correlative mapping of local hysteresis properties in VO

Melissa Alzate Banguero, Sayan Basak, Nicolas Raymond +6

We have developed a new optical microscopy technique able to track micron-sized surface clusters as temperature is varied. Potential candidates for study include phase separated me…

cond-mat.str-el2022★ 5 cited

Deep Learning Hamiltonians from Disordered Image Data in Quantum Materials

S. Basak, M. Alzate Banguero, L. Burzawa +8

The capabilities of image probe experiments are rapidly expanding, providing new information about quantum materials on unprecedented length and time scales. Many such materials fe…

cond-mat.supr-con2021★ 11 cited

Critical Nematic Correlations Throughout the Doping Range in BSCCO

Can-Li Song, Elizabeth J. Main, Forrest Simmons +6

Charge modulations have been widely observed in cuprates, suggesting their centrality for understanding the high- superconductivity in these materials. However, the dimensiona…

cond-mat.str-el2019★ 37 cited

Scale-invariant magnetic textures in the strongly correlated oxide NdNiO

Jiarui Li, Jonathan Pelliciari, Claudio Mazzoli +9

Strongly correlated quantum solids are characterized by an inherently granular electronic fabric, with spatial patterns that can span multiple length scales in proximity to a criti…

cond-mat.str-el2018★ 1 cited

Connecting Complex Electronic Pattern Formation to Critical Exponents

Shuo Liu, E. W. Carlson, K. A. Dahmen

Scanning probes reveal complex, inhomogeneous patterns on the surface of many condensed matter systems. In some cases, the patterns form self-similar, fractal geometric clusters. I…

cond-mat.str-el2018★ 15 cited

Classifying surface probe images in strongly correlated electronic systems via machine learning

L. Burzawa, Shuo Liu, E. W. Carlson

Scanning probe experiments such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on strongly correlated electronic systems often reveal complex pattern form…