Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

Thomas Gawne, Zhandos A. Moldabekov, Oliver S. Humphries +18

Using a novel ultrahigh resolution ($\hat{I}”E\sim 0.1$eV) setup to measure electronic features in x-ray Thomson scattering (XRTS) experiments at the European XFEL in Germany, we have…