collaborators

11 papers

physics.optics2026

Spatiotemporal Terahertz Emission Nanoscopy of Spintronic Photocurrents

F. Paries, R. Rouzegar, J. Cai +9

Capturing ultrafast spin and charge photocurrents on nanoscopic scales is essential for fundamental research in physics and engineering, as well as for future applications, such as…

physics.optics2026

Mach-Zehnder based Rotational Shearing Interferometer for Non-destructive Testing using Spatial Phase-Shifting Shearography

Valentin-Johannes Bastgen, Michael Schuth, Georg von Freymann

This work introduces a novel optical setup based on a Mach-Zehnder interferometer, enabling spatial phase shifting shearography with rotational shear. The optical concept employs a…

physics.optics2026

Accessibility of doping ranges of semiconductors by terahertz spectroscopy

Joshua Hennig, Jens Klier, Stefan Duran +4

While established semiconductor measurement techniques such as four-point probe or capacitance-voltage measurements require a physical contact to the material, terahertz spectrosco…

cs.CV2026

Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection

Jessica Plassmann, Nicolas Schuler, Michael Schuth +1

Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components.…

physics.flu-dyn2026

Converting vertical heat supply into horizontal motion for microtechnological pumping and autonomous waste heat recovery

Jan-Niklas Schäfer, Tillmann Carl, Kristin Kühl +4

The rapid advancement of high-performance computing infrastructure and its extended application produce an increasing amount of waste heat. This heat constitutes an unsustainable l…

cs.CV2025

Unsupervised Learning for Industrial Defect Detection: A Case Study on Shearographic Data

Jessica Plassmann, Nicolas Schuler, Georg von Freymann +1

Shearography is a non-destructive testing method for detecting subsurface defects, offering high sensitivity and full-field inspection capabilities. However, its industrial adoptio…