2 papers
cs.CV2024
Unified Anomaly Detection methods on Edge Device using Knowledge Distillation and Quantization
Sushovan Jena, Arya Pulkit, Kajal Singh +5
With the rapid advances in deep learning and smart manufacturing in Industry 4.0, there is an imperative for high-throughput, high-performance, and fully integrated visual inspecti…
cs.CV2024
Attend, Distill, Detect: Attention-aware Entropy Distillation for Anomaly Detection
Sushovan Jena, Vishwas Saini, Ujjwal Shaw +6
Unsupervised anomaly detection encompasses diverse applications in industrial settings where a high-throughput and precision is imperative. Early works were centered around one-cla…