4 papers
Deep Synthetic Cross-Project Approaches for Software Reliability Growth Modeling
Taehyoun Kim, Duksan Ryu, Jongmoon Baik
Software Reliability Growth Models (SRGMs) are widely used to predict software reliability based on defect discovery data collected during testing or operational phases. However, t…
Improving LLM-Based Fault Localization with External Memory and Project Context
Inseok Yeo, Duksan Ryu, Jongmoon Baik
Fault localization, the process of identifying the software components responsible for failures, is essential but often time-consuming. Recent advances in Large Language Models (LL…
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers
Faisal Mohammad, Duksan Ryu
Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and…
QoS-Aware Graph Contrastive Learning for Web Service Recommendation
Jeongwhan Choi, Duksan Ryu
With the rapid growth of cloud services driven by advancements in web service technology, selecting a high-quality service from a wide range of options has become a complex task. T…