17 citations · 17 across the 1 of their papers we have counts for
1 paper
Pedro C. Feijoo, Thomas Kauerauf, María Toledano-Luque +3
In this paper, the time-dependent dielectric breakdown (TDDB) in sub-1-nm equivalent oxide thickness (EOT) n-type bulk FinFETs is studied. The gate stacks consist of an IMEC clean…