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Tuning the electronic structure of graphene by ion irradiation
Levente Tapaszto, Gergely Dobrik, Peter Nemes-Incze +3
Mechanically exfoliated graphene layers deposited on SiO2 substrate were irradiated with Ar+ ions in order to experimentally study the effect of atomic scale defects and disorder o…
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
P. Nemes-Incze, Z. Osvath, K. Kamaras +1
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon…
Tailoring the atomic structure of graphene nanoribbons by STM lithography
Levente Tapaszto, Gergely Dobrik, Philippe Lambin +1
The practical realization of nano-scale electronics faces two major challenges: the precise engineering of the building blocks and their assembly into functional circuits. In spite…