activity
20072020
most citedA Few Photons Among Many: Unmixing Signal and Noise for Photon-Efficient Active Imaging

263 citations · 1.8k across the 38 of their papers we have counts for

collaborators

38 papers

physics.med-ph2020★ 19 cited

Time-Resolved Focused Ion Beam Microscopy: Modeling, Estimation Methods, and Analyses

Minxu Peng, John Murray-Bruce, Vivek K Goyal

In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a mi…

physics.optics2020★ 124 cited

Compressively sampling the optical transmission matrix of a multimode fibre

Shuhui Li, Charles Saunders, Daniel J. Lum +4

Measurement of the optical transmission matrix (TM) of an opaque material is an advanced form of space-variant aberration correction. Beyond imaging, TM-based methods are emerging…

math.OC2020

SWAGGER: Sparsity Within and Across Groups for General Estimation and Recovery

Charles Saunders, Vivek K Goyal

Penalty functions or regularization terms that promote structured solutions to optimization problems are of great interest in many fields. Proposed in this work is a nonconvex stru…

eess.IV2020★ 4 cited

Two-Dimensional Non-Line-of-Sight Scene Estimation from a Single Edge Occluder

Sheila W. Seidel, John Murray-Bruce, Yanting Ma +3

Passive non-line-of-sight imaging methods are often faster and stealthier than their active counterparts, requiring less complex and costly equipment. However, many of these method…

eess.IV2020★ 76 cited

Seeing Around Corners with Edge-Resolved Transient Imaging

Joshua Rapp, Charles Saunders, Julián Tachella +7

Non-line-of-sight (NLOS) imaging is a rapidly growing field seeking to form images of objects outside the field of view, with potential applications in search and rescue, reconnais…

cond-mat.mtrl-sci2019★ 26 cited

Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement

Minxu Peng, John Murray-Bruce, Karl K. Berggren +1

Focused ion beam (FIB) microscopy suffers from source shot noise - random variation in the number of incident ions in any fixed dwell time - along with random variation in the numb…