◍wovepaper
SearchResearchersInstitutions
Sign in
researcher

N. Schiering

2 papers hereh-index 214 citations4 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author1
  • middle author1

Across the 2 of 2 papers where every author was matched, so the position is known.

fields
  • cs.LG1
  • eess.SY1

identity via Semantic Scholar / OpenAlex

collaborators

2 papers

eess.SY2024

Modelling of measuring systems -- From white box models to cognitive approaches

Nadine Schiering, Sascha Eichstaedt, Michael Heizmann +4

Mathematical models of measuring systems and processes play an essential role in metrology and practical measurements. They form the basis for understanding and evaluating measurem…

cs.LG2024

Data-driven Modeling in Metrology -- A Short Introduction, Current Developments and Future Perspectives

Linda-Sophie Schneider, Patrick Krauss, Nadine Schiering +3

Mathematical models are vital to the field of metrology, playing a key role in the derivation of measurement results and the calculation of uncertainties from measurement data, inf…

◍wovepaper

Papers, researchers and institutions, woven together.

Explore
  • Search
  • Researchers
  • Institutions
Account
  • Library
  • Chat
Data
  • arXiv.org
  • Semantic Scholar
  • OpenAlex
  • Latest RSS
AboutContactPrivacyDevelopersllms.txtopenapi.json
Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.