most citedTheoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials

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cond-mat.mtrl-sci2024★ 14 cited

Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials

Amit Singh, Seunghan Lee, Hyeonhu Bae +3

First-principle calculations were employed to analyze the effects induced by vacancies of molybdenum (Mo) and sulfur (S) on the dielectric properties of few-layered MoS2. We explor…