most citedAnalytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy

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physics.atm-clus2008★ 103 cited

Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy

Franck Bocquet, Laurent Nony, Christian Loppacher +1

An analytical model of the electrostatic force between the tip of a non-contact Atomic Force Microscope (nc-AFM) and the (001) surface of an ionic crystal is reported. The model is…

physics.atm-clus2007★ 43 cited

Noncontact atomic force microscopy simulator with phase-locked-loop controlled frequency detection and excitation

Laurent Nony, Alexis Prof. Baratoff, Dominique Schaer +3

A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digi…