3 papers
cs.CV2025
Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing
Adrian Poniatowski, Natalie Gentner, Manuel Barusco +3
In the semiconductor sector, due to high demand but also strong and increasing competition, time to market and quality are key factors in securing significant market share in vario…
cs.CV2025
Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study
Manuel Barusco, Francesco Borsatti, Youssef Ben Khalifa +2
Semiconductor manufacturing is a complex, multistage process. Automated visual inspection of Scanning Electron Microscope (SEM) images is indispensable for minimizing equipment dow…
cs.CV2024
Unveiling the Anomalies in an Ever-Changing World: A Benchmark for Pixel-Level Anomaly Detection in Continual Learning
Nikola Bugarin, Jovana Bugaric, Manuel Barusco +2
Anomaly Detection is a relevant problem in numerous real-world applications, especially when dealing with images. However, little attention has been paid to the issue of changes ov…