most citedA systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy

4 citations · 4 across the 1 of their papers we have counts for

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1 paper

physics.chem-ph2024★ 4 cited

A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy

Carlos Munoz, Thomas Iken, Nuri Oncel

X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak…