2 citations · 2 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2008
Nanomachining of multilayer graphene using an atomic force microscope
P. Barthold, T. Luedtke, R. J. Haug
An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining a narrow trench. We found a re…
cond-mat.mes-hall2008★ 2 cited
Nanomachining of mesoscopic graphite
P. Barthold, T. Luedtke, R. J. Haug
An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a re…