collaborators

1 paper

cond-mat.mtrl-sci2024

Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN

J. Moneta, M. Krysko, J. Z. Domagala +5

Strain relaxation of thick InGaN layers was studied in order to develop technology of InGaN templates for deposition of InGaN Quantum Wells (QWs) and InGaN layers of high-In-conten…