Ultra high precision refractive index measurement of Si at $\gamma$-ray energies up to 2 MeV

M. M. Günther, M. Jentschel, A. J. Pollitt +2

The refractive index of silicon at $\gamma$-ray energies from 181 - 1959 keV was investigated using the GAMS6 double crystal spectrometer and found to follow the predictions of the clas…