activity
20232026
most citedAddressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images

2 citations · 4 across the 11 of their papers we have counts for

collaborators
Showing 2025Show all

2 papers · 1 filter

cs.LG2025

Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series

Daniel Sorensen, Bappaditya Dey, Minjin Hwang +1

Semiconductor manufacturing is an extremely complex and precision-driven process, characterized by thousands of interdependent parameters collected across diverse tools and process…

cs.LG2025

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series

Bappaditya Dey, Daniel Sorensen, Minjin Hwang +1

Semiconductor manufacturing is an extremely complex process, characterized by thousands of interdependent parameters collected across diverse tools and process steps. Multi-variate…