20 citations · 55 across the 25 of their papers we have counts for
7 papers · 1 filter
SPEAR: Structure Property Explainability with Attention Regularization
Aditya Raghavan, Utkarsh Pratiush, Dalton A. Pearl +4
Machine learning is increasingly used to learn structure property relationships from spectroscopic and diffraction data, yet its adoption in materials discovery is often limited by…
LLM-Guided Open Hypothesis Learning from Autonomous Scanning Probe Microscopy Experiments
Boris Slautin, Utkarsh Pratiush, Yu Liu +2
Autonomous experimentation has transformed microscopy and materials discovery by enabling closed-loop optimization including imaging and spectroscopy tuning, strucutre property rel…
PATHFINDER: Multi-objective discovery in structural and spectral spaces
Kamyar Barakati, Boris N. Slautin, Utkarsh Pratiush +2
Automated decision-making is becoming key for automated characterization including electron and scanning probe microscopies and nano indentation. Most machine learning driven workf…
AI-assisted Human-in-the-Loop Web Platform for Structural Characterization in Hard drive design
Utkarsh Pratiush, Huaixun Huyan, Maryam Zahiri Azar +4
Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer struct…
From Photons to Electrons: Accelerated Materials Discovery via Random Libraries and Automated Scanning Transmission Electron Microscopy
Boris Slautin, Kamyar Barakati, Utkarsh Pratiush +10
The real-world implementation of materials prediction algorithms remains limited by persistent characterization bottlenecks in materials discovery, where photon-based probe techniq…
Novelty-Driven Target-Space Discovery in Automated Electron and Scanning Probe Microscopy
Utkarsh Pratiush, Kamyar Barakati, Boris N. Slautin +4
Modern automated microscopy faces a fundamental discovery challenge: in many systems, the most important scientific information does not reside in the immediately visible image fea…
Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization
Utkarsh Pratiush, Austin Houston, Richard Liu +2
Realizing high-throughput aberration-corrected Scanning Transmission Electron Microscopy (STEM) exploration of atomic structures requires rapid tuning of multipole probe correctors…