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cond-mat.mtrl-sci2024★ 1 cited
Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…
cond-mat.mtrl-sci2023
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…