6 citations · 21 across the 29 of their papers we have counts for
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Sparks of Artificial General Intelligence(AGI) in Semiconductor Material Science: Early Explorations into the Next Frontier of Generative AI-Assisted Electron Micrograph Analysis
Sakhinana Sagar Srinivas, Geethan Sannidhi, Sreeja Gangasani +2
Characterizing materials with electron micrographs poses significant challenges for automated labeling due to the complex nature of nanomaterial structures. To address this, we int…
EMCNet : Graph-Nets for Electron Micrographs Classification
Sakhinana Sagar Srinivas, Rajat Kumar Sarkar, Venkataramana Runkana
Characterization of materials via electron micrographs is an important and challenging task in several materials processing industries. Classification of electron micrographs is co…
Multi-Modal Instruction-Tuning Small-Scale Language-and-Vision Assistant for Semiconductor Electron Micrograph Analysis
Sakhinana Sagar Srinivas, Geethan Sannidhi, Venkataramana Runkana
We present a novel framework for analyzing and interpreting electron microscopy images in semiconductor manufacturing using vision-language instruction tuning. The framework employ…
Hierarchical Network Fusion for Multi-Modal Electron Micrograph Representation Learning with Foundational Large Language Models
Sakhinana Sagar Srinivas, Geethan Sannidhi, Venkataramana Runkana
Characterizing materials with electron micrographs is a crucial task in fields such as semiconductors and quantum materials. The complex hierarchical structure of micrographs often…
Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models
Sakhinana Sagar Srinivas, Geethan Sannidhi, Sreeja Gangasani +2
Characterizing materials using electron micrographs is crucial in areas such as semiconductors and quantum materials. Traditional classification methods falter due to the intricate…
Foundational Model for Electron Micrograph Analysis: Instruction-Tuning Small-Scale Language-and-Vision Assistant for Enterprise Adoption
Sakhinana Sagar Srinivas, Chidaksh Ravuru, Geethan Sannidhi +1
Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We intr…