collaborators

1 paper

cond-mat.mes-hall2026

Determining Electron Beam Lateral Coherence in a Scanning Electron Microscope Using Electron Diffraction

Evelijn Akerboom, Fatemeh Kiani, Giulia Tagliabue +4

We develop and characterize scanning transmission electron microscopy (STEM) capabilities within a scanning electron microscope (SEM) to investigate the effective lateral coherence…