2 citations · 2 across the 2 of their papers we have counts for
2 papers
cs.CV2024★ 2 cited
Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer
Binh Duong Nguyen, Johannes Steiner, Peter Wellmann +1
Detecting and analyzing various defect types in semiconductor materials is an important prerequisite for understanding the underlying mechanisms as well as tailoring the production…
cs.LG2023
Efficient Surrogate Models for Materials Science Simulations: Machine Learning-based Prediction of Microstructure Properties
Binh Duong Nguyen, Pavlo Potapenko, Aytekin Dermici +3
Determining, understanding, and predicting the so-called structure-property relation is an important task in many scientific disciplines, such as chemistry, biology, meteorology, p…