1 citations · 1 across the 3 of their papers we have counts for
3 papers
cs.CV2024★ 1 cited
Utilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition
Qiyu Wei, Xun Xu, Zeng Zeng +1
The patterns on wafer maps play a crucial role in helping engineers identify the causes of production issues during semiconductor manufacturing. In order to reduce costs and improv…
cs.CV2023
Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation
Qiyu Wei, Wei Zhao, Xiaoyan Zheng +1
As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increas…
cs.CV2023
A Deeply Supervised Semantic Segmentation Method Based on GAN
Wei Zhao, Qiyu Wei, Zeng Zeng
In recent years, the field of intelligent transportation has witnessed rapid advancements, driven by the increasing demand for automation and efficiency in transportation systems.…