most citedA method to quantitatively evaluate Hamaker constant using the jump-into-contact effect in Atomic Force microscopy

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cond-mat.mtrl-sci2008★ 48 cited

A method to quantitatively evaluate Hamaker constant using the jump-into-contact effect in Atomic Force microscopy

Soma Das, P. A. Sreeram, A. K. Raychaudhuri

We find that the jump-into-contact of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is…