most citedObservation of Spin Fluctuations in a High-Tc Parent Compound Using Resonant Inelastic X-ray Scattering

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cond-mat.mtrl-sci2008

Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray absorption spectroscopy

H. Kohlstedt, A. Petraru, M. Meier J. Denlinger +11

We applied soft X-ray absorption spectroscopy to study the Ti L-edge in ferroelectric capacitors using a modified total electron yield method. The inner photo currents and the X-ra…