33 citations · 63 across the 4 of their papers we have counts for
1 paper · 2 filters
Amrit Laudari, Sameera Pathiranage, Salim A. Thomas +5
We performed X-ray photoelectron spectroscopy (XPS) measurements on a thin film of Si nanocrystals (SiNCs) while applying DC or AC external biases to extract the resistance and the…