most citedSEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering

12 citations · 12 across the 1 of their papers we have counts for

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1 paper

cs.CV2023★ 12 cited

SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering

MinJin Hwang, Bappaditya Dey, Enrique Dehaerne +2

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rend…