most citedAbsolute spectral metrology of XFEL pulses using diffraction in crystals

2 citations · 2 across the 2 of their papers we have counts for

collaborators

2 papers

physics.ins-det2024

Development of crystal optics for Multi-Projection X-ray Imaging for synchrotron and XFEL sources

Valerio Bellucci, Sarlota Birnsteinova, Tokushi Sato +27

X-ray Multi-Projection Imaging (XMPI) is an emerging technology that allows for the acquisition of millions of 3D images per second in samples opaque to visible light. This breakth…

physics.ins-det2023★ 2 cited

Absolute spectral metrology of XFEL pulses using diffraction in crystals

Ilia Petrov, Liubov Samoylova, Sarlota Birnsteinova +13

At modern X-ray sources, such as synchrotrons and X-ray Free-Electron Lasers (XFELs), it is important to measure the absolute value of the photon energy directly. Here, a method fo…