most citedA Multi-scale Approach for Simulations of Kelvin Probe Force Microscopy with Atomic Resolution

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cond-mat.mtrl-sci2012★ 74 cited

A Multi-scale Approach for Simulations of Kelvin Probe Force Microscopy with Atomic Resolution

Ali Sadeghi, Alexis Baratoff, S. Alireza Ghasemi +4

The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting sampl…