2 papers
physics.app-ph2024
Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films using a Dual-Beam FIB-SEM
Supriya Ghosh, Fengdeng Liu, Sreejith Nair +2
Plan-view transmission electron microscopy (TEM) samples are key to understand the atomic structure and associated properties of materials along their growth orientation, especiall…
cond-mat.mtrl-sci2023
Mending Cracks in Rutile TiO with Electron Beam
Silu Guo, Hwanhui Yun, Sreejith Nair +2
Restructuring of rutile TiO under electron beam irradiation driven by radiolysis was observed and analyzed using a combination of atomic-resolution imaging and electron energ…