2 papers
cond-mat.mtrl-sci2026
Spatially resolved elastic strain and lattice rotation at threading dislocations in HgCdTe/CdZnTe epilayers by dark-field X-ray microscopy
C. Yildirim, A. Benhadjira, P. Ballet +5
Threading dislocations (TDs) propagating from a CdZnTe (CZT) substrate into a liquid-phase-epitaxy HgCdTe (MCT) epilayer set the minority-carrier lifeti…
physics.optics2025
Quantifying Resolution in Pink Beam Dark Field X-ray Microscopy: Experiments and Simulations
Michela La Bella, Henning Friis Poulsen, Steffen Staeck +4
Pink-beam Dark-Field X-ray Microscopy (pDFXM) is a powerful emerging technique for time-resolved studies of microstructure and strain evolution in bulk crystalline materials. In th…