most citedSensing Remote Bulk Defects Through Resistance Noise in a Large Area Graphene Field Effect Transistor

1 citations · 1 across the 2 of their papers we have counts for

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2 papers

cond-mat.mes-hall2025

Single-Defect Spectroscopy via Random Telegraph Noise in Graphene-Contacted ReS-hBN Heterostructures

Shubhrasish Mukherjee, Gaurab Samanta, Shubhadip Moulick +5

Defect spectroscopy in two-dimensional (2D) field-effect transistors (FETs) requires device architectures that suppress contact and disorder artifacts while preserving intrinsic ca…

cond-mat.mes-hall2022★ 1 cited

Sensing Remote Bulk Defects Through Resistance Noise in a Large Area Graphene Field Effect Transistor

Shubhadip Moulick, Rafiqul Alam, Atindra Nath Pal

Substrate plays a crucial role in determining transport and low frequency noise behavior of graphene field effect devices. Typically, heavily dope Si/SiO substrate is used to f…