11 citations · 19 across the 11 of their papers we have counts for
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Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation
Alex W. Robinson, Daniel Nicholls, Jack Wells +3
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images c…