Improvement of a focused ion beam fabricated diamond pillar for scanning ensemble nitrogen-vacancy magnetometry probe using an ultrapure diamond

Dwi Prananto, Yifei Wang, Yuta Kainuma +3

Scanning diamond nitrogen-vacancy probe microscopy (SNVM) is an important tool for studying nanoscale condensed-matter phenomena. Ga${}^{+}$-ion-focused-ion-beam (FIB) milling has been…