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20222026
most citedSimultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

17 citations · 20 across the 7 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

6 papers · 1 filter

cond-mat.mtrl-sci2026

Cumulative X-ray Damage in Bismuth Selenide Examined by Simultaneous TXM and XRD

Sophie E Parsons, Bernard Kozioziemski, Daewoong Nam +21

Bismuth selenide (Bi2Se3) is a topological insulator with potential applications in thermoelectrics, spintronics, and optoelectronics. However, its response to radiation remains po…

cond-mat.mtrl-sci2024

Comment on "Comments regarding "Transonic dislocation propagation in diamond" by Katagiri, et al. (Science 382, 69-72, 2023)" by Hawreliak, et al. (arXiv:2401.04213)

Kento Katagiri, Tatiana Pikuz, Lichao Fang +24

In their comment (1), Hawreliak et al. claims that our observation of stacking fault formation and transonic dislocation propagation in diamond (2) is not valid as they interpret t…

cond-mat.mtrl-sci2024

X-ray induced grain boundary formation and grain rotation in Bi2Se3

Kento Katagiri, Bernard Kozioziemski, Eric Folsom +24

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, in…

cond-mat.mtrl-sci2023★ 1 cited

Transonic Dislocation Propagation in Diamond

Kento Katagiri, Tatiana Pikuz, Lichao Fang +24

The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations pre…

cond-mat.mtrl-sci2022★ 2 cited

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder +10

Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determin…

cond-mat.mtrl-sci2022★ 17 cited

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad +40

The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural…