most citedMeasurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers

4 citations · 4 across the 1 of their papers we have counts for

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1 paper

physics.optics2022★ 4 cited

Measurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers

Jingwei Li, Ruixuan Wang, Lutong Cai +1

The unique material property of silicon carbide (SiC) and the recent demonstration of low-loss SiC-on-insulator integrated photonics platform have attracted considerable research i…