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20222025
most citedMeasurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers

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physics.app-ph2024

Physical Vapor Deposition of High Mobility P-type Tellurium and its Applications for Gate-tunable van der Waals PN Photodiodes

Tianyi Huang, Sen Lin, Jingyi Zou +9

Recently tellurium (Te) has attracted resurgent interests due to its p-type characteristics and outstanding ambient environmental stability. Here we present a substrate engineering…