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cs.LG2022
Experts in the Loop: Conditional Variable Selection for Accelerating Post-Silicon Analysis Based on Deep Learning
Yiwen Liao, Raphaël Latty, Bin Yang
Post-silicon validation is one of the most critical processes in modern semiconductor manufacturing. Specifically, correct and deep understanding in test cases of manufactured devi…
cs.LG2022
Deep Feature Selection Using a Novel Complementary Feature Mask
Yiwen Liao, Jochen Rivoir, Raphaël Latty +1
Feature selection has drawn much attention over the last decades in machine learning because it can reduce data dimensionality while maintaining the original physical meaning of fe…