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cs.CV2025
Towards Pixel-Wise Anomaly Location for High-Resolution PCBA via Self-Supervised Image Reconstruction
Wuyi Liu, Le Jin, Junxian Yang +5
Automated defect inspection of assembled Printed Circuit Board Assemblies (PCBA) is quite challenging due to the insufficient labeled data, micro-defects with just a few pixels in…
cs.CV2025
SASep: Saliency-Aware Structured Separation of Geometry and Feature for Open Set Learning on Point Clouds
Jinfeng Xu, Xianzhi Li, Yuan Tang +5
Recent advancements in deep learning have greatly enhanced 3D object recognition, but most models are limited to closed-set scenarios, unable to handle unknown samples in real-worl…
cs.CV2025
MoST: Efficient Monarch Sparse Tuning for 3D Representation Learning
Xu Han, Yuan Tang, Jinfeng Xu +1
We introduce Monarch Sparse Tuning (MoST), the first reparameterization-based parameter-efficient fine-tuning (PEFT) method tailored for 3D representation learning. Unlike existing…