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Dataset and Methodology for Material Identification Using AFM Phase Approach Curves
Stefan R. Anton, Denis E. Tranca, Stefan G. Stanciu +2
Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated a…
Inferring scattering-type Scanning Near-Field Optical Microscopy Data from Atomic Force Microscopy Images
Stefan G. Stanciu, Stefan R. Anton, Denis E. Tranca +7
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy…
rSHG: Re-scan Second Harmonic Generation Microscopy
Stefan G. Stanciu, Radu Hristu, George A. Stanciu +9
Second Harmonic Generation Microscopy (SHG) is generally acknowledged as a powerful tool for the label-free 3D visualization of tissues and advanced materials, with one of its most…