3 papers
cond-mat.mtrl-sci2024
Measurement of electron beam induced sample heating in SEM experiments
Christina Koenig, Alice Bastos da Silva Fanta, Joerg R. Jinschek
Scanning Electron Microscopy (SEM) experiments provide detailed insights into material microstructures, enabling high-resolution imaging as well as crystallographic analysis throug…
cond-mat.mtrl-sci2024
Improving the Accuracy of Temperature Measurement on TEM samples using Plasmon Energy Expansion Thermometry (PEET): Addressing Sample Thickness Effects
Yi-Chieh Yang, Luca Serafin, Nicolas Gauquelin +2
Advances in analytical scanning transmission electron microscopy (STEM) and microelectronic mechanical systems (MEMS) based microheaters have enabled in-situ materials characteriza…
cond-mat.mtrl-sci2024
Single electron self-coherence and its wave/particle duality in the electron microscope
Christian Kisielowski, Petra Specht, Joerg R. Jinschek +1
Intensities in high-resolution phase-contrast images from electron microscopes build up discretely in time by detecting single electrons. A wave description of pulse-like coherent-…