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cs.CV2025
Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models
Wei-Lung Mao, Chun-Chi Wang, Po-Heng Chou +1
Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it…
cs.CV2025
YOLO-Based Defect Detection for Metal Sheets
Po-Heng Chou, Chun-Chi Wang, Wei-Lung Mao
In this paper, we propose a YOLO-based deep learning (DL) model for automatic defect detection to solve the time-consuming and labor-intensive tasks in industrial manufacturing. In…